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Documents
- Optimal test suite generation subject to time and cost constraints (Alan Hartman/Haifa/IBM, Aviad Zlotnick/Haifa/IBM, Irith Ben-Arroyo Hartman) disclosure number IL8-2002-0034 (rated file).
- Reducing the complexity of finite state machine test generation using combinatorial designs (A. Hartman, A. Kirshin, K. Nagin, S. Olvovsky) disclosure number IL8-2001-0092 (rated file).
- More effective use of model based test generation for validating concurrent and parallel software, (A. Hartman, A. Kirshin, K. Nagin, S. Olvovsky) IL8-2001-0054 (rated file).
- Recursive use of model based test generation for middleware validation, (A. Hartman, K. Nagin, G. Sharon) disclosure number IL8-2001-0021 (rated file).
- Persistent foci for finite state machine based software test generation (A. Hartman, P. Kram, K. Nagin) disclosure number IL9-2000-0079, (filed).
- Integrating test coverage measurement with model based test generation to improve software test suites, (E. Farchi, D. Geist, A. Hartman, P. Kram, K. Nagin, Y. Shaham-Gafni, S. Ur), disclosure number GB8-2000-0017 (filed).
- State transition rule based automated test generation for non-deterministic software, (E. Farchi, A. Hartman, P. Kram, and K. Nagin), disclosure number GB8-2000-0014 (filed).
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